PARTICLE DETECTION
SMART SENSOR

Another leading-edge solution from Sistem Technology’s Partners

Image
Image

We are excited to release a new product that detects particles in load ports, atmospheric wafer transfer areas, and other non-corrosive process environments.

Image
Image

The sensor samples air from the laminar flow of the environment to detect particles down to 0.3μm in size. It's small enough to be mounted inside a load port or wafer transfer area to provide continuous particle monitoring 24 hours a day.

The quantity and concentrations for 0.3μm, 0.5μm, 1μm, 2.5μm, 4.0μm and 10μm particles can be viewed at the equipment using an optional OLED display.

Image
Image

The count, concentration, and/or average size for a user defined particle size range is logged for up to one year with our Data Acquisition Smart Sensor platform.

This product is applicable to all process and inspection tools in the fab. Equipment with load ports as well as internal wafer handling robots are all candidates for this product.
Image
Benefits
Improves device/wafer yield Finds sources of contamination Reduces/eliminates monitor wafers Speeds equipment qualification after maintenance Prevents unscheduled downtime